Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-08-28
2007-08-28
Tran, Phuoc (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S191000, C382S224000
Reexamination Certificate
active
11645260
ABSTRACT:
A computer program product for detecting anomalies from multidimensional data comprises: a) receiving multidimensional data; b) estimating background parameters of a normal compositional model from the multidimensional data; c) estimating abundance values of the normal compositional model from the background parameters and the multidimensional data; d) determining an anomaly detection statistic from the multidimensional data, the background parameters, and abundance values; and e) classifying an observation from the multidimensional data as either a background reference or an anomaly from the anomaly detection statistic.
REFERENCES:
patent: 6353673 (2002-03-01), Shnitser et al.
patent: 6587575 (2003-07-01), Windham et al.
Kagen Michael A.
Lee Allan Y.
Lipovsky Peter A.
Tran Phuoc
United States of America as represented by the Secretary of the
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