Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-10-14
2009-11-17
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S073100
Reexamination Certificate
active
07619435
ABSTRACT:
A method and system for multi-point (e.g., double-point) GOI test that can efficiently judge failure modes by testing only two points. We can measure leakage currents at only two voltages, which are the cut points of mode A-B and B-C, instead of the whole ramped voltages to save time and cost with the same test effectiveness according to a specific embodiment. By correlating leakage current at extrinsic field to the breakdown voltage, we can also evaluate the intrinsic reliability even if the samples are not subjected to actual breakdown according to a specific embodiment.
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Chien W. T. Kary
Gong Excimer
Tseng Summer
Zhao Atman
Nguyen Ha Tran T
Semiconductor Manufacturing International (Shanghai) Corporation
Townsend and Townsend / and Crew LLP
Vazquez Arleen M
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