Method and system for defect investigation of component

Details Method and system for defect investigation of component Method and system for defect investigation of component

2006-10-02

2010-02-16

Chapman, John E (Department: 2856)

Measuring and testing

Vibration

By mechanical waves

C073S629000

Reexamination Certificate

active

07661314

ABSTRACT:
One surface of a component is obliquely ensonified through a liquid or gaseous first medium with a checking sound beam produced by a transmission/reception transducer for defect investigation of the component. A response sound beam, which is reflected back from the surface to the transmission/reception transducer, is received and its delay time in the medium between the transmission/reception transducer and the surface is evaluated. The delay time in the medium determined in this way is taken into account for localization of a defect within the component.

REFERENCES:
patent: 4510811 (1985-04-01), Sternberg et al.
patent: 5507184 (1996-04-01), Freund et al.
patent: 5623100 (1997-04-01), Arima et al.
patent: 42 23 502 (1994-01-01), None

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