Method and system for defect detection

Details Method and system for defect detection Method and system for defect detection

2011-06-28

2011-06-28

Chawan, Sheela C (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S205000, C382S274000, C358S003010

Reexamination Certificate

active

07970201

ABSTRACT:
A system, method and computer program product for defect detection, the method includes: (i) retrieving a second pixel of a second image that corresponds to a tested pixel of a first image of the object; wherein the first and second images were obtained using different acquisition methods; (ii) searching a third pixel of the second image such that a neighborhood of the second pixel is similar to a neighborhood of the third pixel; (iii) retrieving a fourth pixel of the first image that corresponds to the third pixel; and (iv) comparing between the tested pixel and the fourth pixel.

REFERENCES:
patent: 4791675 (1988-12-01), Deering et al.
patent: 7133548 (2006-11-01), Kenan et al.
patent: 7274825 (2007-09-01), Lee et al.
patent: 7528943 (2009-05-01), Brown et al.
patent: 7570800 (2009-08-01), Lin et al.
patent: 7711177 (2010-05-01), Leslie et al.

Affiliated with

Also associated with

Rating

Method and system for defect detection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for defect detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for defect detection will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2701212