Method and system for data classification in the presence of...

Details Method and system for data classification in the presence of... Method and system for data classification in the presence of...

2009-01-12

2010-10-19

Wong, Don (Department: 2163)

Data processing: database and file management or data structures

Database and file access

Post processing of search results

C707S729000

Reexamination Certificate

active

07818318

ABSTRACT:
A method and system for determining a feature of a particular pattern are provided. In particular, data records are received, and predetermined patterns that are associated with at least some of the data records are obtained. Using the system and method, particular information is extracted from at least a subset of the received data records, the particular information being indicative of the particular pattern in at least some of the data records. Then, it is determined whether the particular pattern is an unexpected pattern based on the obtained predetermined patterns. In addition, it is possible to classify and reduce data and/or parameters provided in the data records. First, the data records are received. Then, the data records which have at least one particular pattern are classified using a Multivariate Adaptive Regression Splines technique. Thereafter, the data and/or parameters of the classified data records are shrunk using a Stein's Estimator Rule technique.

REFERENCES:
patent: 6138117 (2000-10-01), Bayardo
patent: 6208720 (2001-03-01), Curtis et al.
patent: 6665669 (2003-12-01), Han et al.
patent: 6772152 (2004-08-01), Wang et al.
patent: 6799175 (2004-09-01), Aggarwal
Balaji Padmanabhan and Alexander Tuzhilin (2000), Small is Beautiful: Discovering the Minimal Set of Unexpected Patterns, pp. 54-63.

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