Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-02-27
2007-02-27
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S108000, C702S119000, C702S121000, C702S122000, C702S123000
Reexamination Certificate
active
10917916
ABSTRACT:
A method for integrating test modules in a modular test system is disclosed. The method includes controlling at least one test module and its corresponding device under test (DUT) with a controller, establishing a standard module control interface between a vendor-supplied test module and the modular test system with a module control framework, installing the vendor-supplied test module and a corresponding vendor-supplied control software module, where the vendor-supplied control software module is organized into a plurality of vendor-supplied module control components, configuring the modular test system based on the module control framework and the plurality of vendor-supplied module control components, and accessing the vendor-supplied test module in accordance with the plurality of vendor-supplied module control components using the module control framework.
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Adachi Toshiaki
Elston Mark
Pramanick Ankan
Advantest America R&D Center, Inc.
Hoff Marc S.
Huynh Phuong
Morrison & Foerster / LLP
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