Method and system for controlling a semiconductor...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Making emissive array

Reexamination Certificate

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Reexamination Certificate

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07964422

ABSTRACT:
A method for controlling a semiconductor fabrication process includes the steps of analyzing process-data related to an intermediate-process-step in the fabrication process and adjusting a metal-layer-parameter corresponding to the metal layer based on the process-data.

REFERENCES:
patent: 5270222 (1993-12-01), Moslehi
patent: 6823231 (2004-11-01), Bode et al.
patent: 6842661 (2005-01-01), Chong et al.
patent: 6995849 (2006-02-01), Uno et al.
patent: 7076318 (2006-07-01), Hayashi
patent: 7176133 (2007-02-01), Hues et al.
patent: 2004/0115843 (2004-06-01), Wack et al.

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