Data processing: database and file management or data structures – Database design – Data structure types
Reexamination Certificate
2005-11-08
2009-08-25
Wong, Don (Department: 2163)
Data processing: database and file management or data structures
Database design
Data structure types
C707S793000
Reexamination Certificate
active
07580924
ABSTRACT:
A server system for receiving and processing manufacturing data from a plurality of semi-conductor manufacturers is disclosed. The server system includes: a file capture module for receiving the manufacturing data from the plurality of semi-conductor manufacturers; a format conversion module coupled to the file capture module, the format conversion module converting the manufacturing data to a standard database format for storage in a database; a query builder module coupled to a client web browser for interactively changing contents of the client web browser depending upon a plurality of client selections on the client web browser, the query builder module configured to build a final query based on the plurality of client selections; and a report generation module coupled to the database and the query builder module, the report generation module generating a report based on the final query.
REFERENCES:
patent: 5623403 (1997-04-01), Highbloom
patent: 6148307 (2000-11-01), Burdick et al.
patent: 6571232 (2003-05-01), Goldberg et al.
patent: 7218980 (2007-05-01), Orshansky et al.
patent: 2003/0033287 (2003-02-01), Shanahan et al.
patent: 2003/0037044 (2003-02-01), Boreham et al.
patent: 2003/0061200 (2003-03-01), Hubert et al.
patent: 2003/0061201 (2003-03-01), Grefenstette et al.
patent: 2003/0208480 (2003-11-01), Faulkner et al.
patent: 2004/0162816 (2004-08-01), Irle et al.
patent: 2004/0225649 (2004-11-01), Yeo et al.
patent: 2004/0254915 (2004-12-01), Motoyama et al.
patent: 2005/0114304 (2005-05-01), White et al.
patent: 2005/0114326 (2005-05-01), Smith et al.
patent: 2005/0288815 (2005-12-01), Kawahara et al.
patent: 2006/0106473 (2006-05-01), Enright et al.
patent: 2006/0143244 (2006-06-01), Chia
Keith Baker et al.; “Shmoo Plotting: The Black Art of IC Testing”; Proceedings of the International Test Conference (ITC'96) @1996 IEEE; pp. 1-2.
Yield Dynamics; “Genesis Enterprise”; downloaded on Sep. 19, 2005 from http:/ /www.ydyn.com/products/ genesis—enterprise.htm; pp. 1-4.
KLA Tencor; “Klarity ACE XP”; downloaded on Sep. 19, 2005 from http:/ /www.kla-tencor.com/j/servlet/ Product?prodID=25&focus=1; pp. 1-4.
U.S. Appl. No. 11/192,344, filed Jul. 28, 2005, Ling et al.
Flynn Andrew John
Ling Christopher Lanseng
Manicle Noel John
Simmons Michael Leonard
Kanzaki Kim
Nguyen Kim T
Webostad W. Eric
Wong Don
Xilinx , Inc.
LandOfFree
Method and system for collection, analysis, and display of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for collection, analysis, and display of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for collection, analysis, and display of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4100744