Method and system for characterizing an integrated circuit...

Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing

Reexamination Certificate

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C716S104000, C716S106000, C716S110000

Reexamination Certificate

active

07900174

ABSTRACT:
A method and a system for characterizing an integrated circuit (IC) design are disclosed. The method includes receiving a description of leaf cells used in the IC design. The IC design is described in a high-level language by using the description of the leaf cells. The description of the IC design includes specifying placement of the leaf cells and specifying connectivity between them. Further, the method includes extracting a circuit netlist file based on the physical layout of the IC design. The instructions are defined in the high-level language to perform simulations on the extracted circuit netlist file. These simulations are performed on the circuit netlist file to determine the values of the design parameters. Furthermore, the method includes providing the values of the design parameters of the IC design in a pre-defined output format based on the simulations.

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Agarwal et al., “System-Level Modeling Environment: MLDesigner,” Syscon 2008—IEEE Int'l Syste,s Conference, Montreal, Canada, Apr. 7-10, 2008, 7 pages.
Jayadevappa et al., “A Comparative Study of Modeling at Different Levels of Abstraction in System on Chip Designs: A Case Study,” Proc. of IEEE Computer Society Annual Symposium on VLSI Emerging Trends in VLSI Systems Design (ISVLS'04), 2004, 7 pages.
Zarrineh et al., “Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors,” 2001 IEEE, pp. 526-529.

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