Method and system for calibrating an x-ray scanner from the imag

Details Method and system for calibrating an x-ray scanner from the imag Method and system for calibrating an x-ray scanner from the imag

1992-05-14

1993-07-06

Envall, Jr., Roy N.

Boots, shoes, and leggings

378207, 2502521, G06F 1500

Patent

active

052259790

ABSTRACT:
A method and a system for calibrating an x-ray scanner, in which the lengths d.sub.ij of x-ray paths are first computed by means of the image of the calibration standard. There are then computed both the theoretical attenuations Ac.sub.ij and the attenuations Am.sub.ij measured on the image. There are then deduced the coefficient of proportionality K between the values Ac.sub.ij and Am.sub.ij in order to obtain values of K.times.Ac.sub.i. The values KAc.sub.i and Am.sub.i are employed for calculating the corrections to be made per channel as a function of the attenuation.

REFERENCES:
patent: 4035651 (1977-06-01), LeMay
patent: 4352020 (1982-09-01), Horiba et al.
patent: 4789930 (1988-12-01), Sones et al.

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