Method and system for calibrating an x-ray scanner by employing

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378207, G06F 1542, A61B 600, G01D 1800

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active

050954318

ABSTRACT:
The invention relates to x-ray scanners and more particularly to a method for calibrating scanners by means of a single standard of elliptical shape, for example. Attenuation measurements are performed with respect to a number of principal angular positions of the scanner about the standard. In addition, a number of meaurements or views are taken on each side of this principal position in order to compute a mean attenuation with respect to each channel. The attenuation curve is then smoothed by filtering and polynomial approximation.

REFERENCES:
patent: 4225789 (1980-09-01), Albrecht
patent: 4331869 (1982-05-01), Rollo
patent: 4352020 (1982-09-01), Horiba et al.
patent: 4400827 (1983-08-01), Spears
patent: 4497061 (1985-01-01), Hounsfield
patent: 4663772 (1987-05-01), Mattson et al.
patent: 4873707 (1989-10-01), Robertson
Gonzalez et al., Digital Image Processing, Addison-Wesley Pub. Co., 1987, pp. 163-175.

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