Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Calibration
Reexamination Certificate
2006-03-28
2006-03-28
Nolan, Jr., Charles H. (Department: 2854)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Calibration
C324S638000
Reexamination Certificate
active
07019535
ABSTRACT:
A method and system of calibrating first and second adapters comprises the steps of calibrating coaxial ports of a vector network analyzer to traceable standards and connecting a symmetrical through circuit path between the coaxial ports. The through circuit path comprises a cascaded combination of the first and second adapters. The first adapter is passive and substantially identical to the second adapter and uncascaded first and second adapters comprise a measurement device path. The through circuit path and the measurement device path have substantially equivalent S-parameters. S-parameters of the through circuit path are measured and then the first and second adapters are characterized based upon the measured S-parameters. The method and system may be applied to two port adapters and devices under test and may also be scaled for multi-port adapters and devices under test.
REFERENCES:
patent: 4845423 (1989-07-01), Pollard
patent: 4982164 (1991-01-01), Schiek et al.
patent: 5047725 (1991-09-01), Strid et al.
patent: 5091709 (1992-02-01), Pollard
patent: 5434511 (1995-07-01), Adamian et al.
patent: 5467021 (1995-11-01), Adamian et al.
patent: 5537046 (1996-07-01), Adamian et al.
patent: 5548221 (1996-08-01), Adamian et al.
patent: 5552714 (1996-09-01), Adamian et al.
patent: 5578932 (1996-11-01), Adamian
patent: 5715183 (1998-02-01), Grace et al.
patent: 6643597 (2003-11-01), Dunsmore
patent: 6650123 (2003-11-01), Martens
patent: 2004/0010384 (2004-01-01), Jacobsen et al.
patent: 2004/0095145 (2004-05-01), Boudiaf et al.
patent: 2004/0246004 (2004-12-01), Heuermann
patent: 2005/0030047 (2005-02-01), Adamian
patent: 2337604 (1999-11-01), None
L.W. Rabiner, R. Schafer, and C.M. Rader, The Chirp z-transform Algorithm:, IEEE Transactions on Audio and Electroacoustics, vol. AU-17, No. 2, Jun. 1969, pp. 86-92.
Andrea Ferrero and Umberto Pisani, “Two-Port Network Analyzer Calibration Using an Unknown ‘Thru’”, IEEE Microwave and Guided Wave Letters, vol. 2, No. 12, Dec. 1992, pp. 505-514.
Agilent Technologie,s Inc.
Nolan, Jr. Charles H.
LandOfFree
Method and system for calibrating a measurement device path... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and system for calibrating a measurement device path..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for calibrating a measurement device path... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3605094