Method and system for automatic vision inspection and...

Image analysis – Applications – Biomedical applications

Reexamination Certificate

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C382S168000, C382S133000, C382S134000, C422S063000, C422S068100, C422S105000, C422S105000, C356S614000, C356S237100, C356S237600

Reexamination Certificate

active

07551762

ABSTRACT:
The present invention provides a unique low cost vision inspection and classification system and methods for automatic inspection and classification of a microarray slide without manual intervention. The method first performs morphological dilation operation several times such that internal microarray spots are merged as a big connected component; then, the orientation of the merged spots, with respect to the X-axis and Y-axis is computed by computing the angle of the external boundaries of the connected component using Sobel XY operators for both edges and orientation determination, or using the moment-based algorithm for direct orientation determination; and the translational offset is determined by finding the X and Y centroids of the connected component. Moreover, the present invention provides threshold methods for classifying spots into normal spots, weak spots, missing spots, or overlapping spots.

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patent: WO2004/017376 (2004-02-01), None
Gridline: Automatic Grid Alignment in DNA Microarray Scans Peter Bajcsy.

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