Method and system for automated outlying feature and...

Image analysis – Applications – Biomedical applications

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

06993172

ABSTRACT:
A method and system for employing pixel-based, signal-intensity data contained within areas of a scanned image of a molecular array corresponding to features and feature backgrounds in order to determine whether or not the features or feature backgrounds have non-uniform signal intensities and are thus outlier features and outlier feature backgrounds. A calculated, estimated variance for the signal intensities within a feature or feature background is compared to a maximum allowable variance calculated for the feature or feature background based on a signal intensity variance model. When the experimental variance is less than or equal to the maximum allowable variance, the feature or feature background is considered to have acceptable signal-intensity uniformity. Otherwise, the feature or feature background is flagged as an outlier feature or outlier feature background.

REFERENCES:
patent: 5837475 (1998-11-01), Dorsel et al.
patent: 6083763 (2000-07-01), Balch
patent: 6100030 (2000-08-01), McCasky Feazel et al.
patent: 6122407 (2000-09-01), Peters
patent: 6249593 (2001-06-01), Chu et al.
patent: 6341182 (2002-01-01), Fitzgerald et al.
patent: 6344316 (2002-02-01), Lockhart et al.
patent: 6349144 (2002-02-01), Shams
patent: 6355423 (2002-03-01), Rothberg et al.
patent: 6516276 (2003-02-01), Ghandour et al.
patent: 0 902 394 (1999-03-01), None
patent: 0 998 137 (2000-05-01), None
patent: 1 162 572 (2001-12-01), None
patent: WO 01/55967 (2001-08-01), None
European Patent Office Communication dated Nov. 6, 2003, enclosure of European Search Report and Annex to the EP Search Report for counterpart EP Application 02 25 4524.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for automated outlying feature and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for automated outlying feature and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for automated outlying feature and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3566538

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.