Measuring and testing – Moisture content or absorption characteristic of material
Reexamination Certificate
2007-05-09
2009-06-30
Williams, Hezron (Department: 2856)
Measuring and testing
Moisture content or absorption characteristic of material
Reexamination Certificate
active
07552624
ABSTRACT:
A method for detecting moisture in a display device having at least one display element includes incorporating at least one moisture detector in a predetermined location of the display device, the moisture detector including a material layer comprising metal formed between a first electrode and a second electrode. One or more display elements are encapsulated between a first and second shields. A resistance of the material layer is detected so as to determine a level of moisture.
REFERENCES:
patent: 6339289 (2002-01-01), Fork
patent: 6424326 (2002-07-01), Yamazaki et al.
patent: 6635988 (2003-10-01), Izumizawa et al.
patent: 7256542 (2007-08-01), Chiu et al.
patent: 2003/0071804 (2003-04-01), Yamazaki et al.
patent: 2003/0152801 (2003-08-01), Liao et al.
patent: 2005/0184661 (2005-08-01), Chiu et al.
patent: 02-179449 (1990-07-01), None
patent: 05-240823 (1993-09-01), None
patent: 2003-157970 (2003-05-01), None
patent: WO 00/60904 (2000-12-01), None
Chiu Chun-Yi
Su Chih-Hung
Au Optronics Corporation
Duane Morris LLP
Gissel Gunnar J
Williams Hezron
LandOfFree
Method and structures for detecting moisture in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and structures for detecting moisture in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and structures for detecting moisture in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4085074