Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-03-27
2007-03-27
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S108000, C702S120000, C702S121000, C702S122000, C702S123000, C717S124000
Reexamination Certificate
active
10918714
ABSTRACT:
A method for developing a test program for a semiconductor test system is disclosed. The method includes describing a test plan file in a test program language (TPL), where the test plan file describes at least one test of the test program, describing a test class file in a system program language (SPL) and a corresponding pre-header file of the test class file in the TPL, where the test class file describes an implementation of the at least one test of the test program, and generating the test program using the test plan file, the test class file, and the pre-header file.
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Adachi Toshiaki
Elston Mark
Krishnaswamy Ramachandran
Pramanick Ankan
Advantest America R&D Center, Inc.
Huynh Phuong
Morrison & Foerster / LLP
Raymond Edward
LandOfFree
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