Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-04-24
2007-04-24
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S108000, C702S120000, C702S121000, C702S122000, C717S124000
Reexamination Certificate
active
10918513
ABSTRACT:
A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.
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Adachi Toshiaki
Elston Mark
Pramanick Ankan
Singh Harsanjeet
Tahara Yoshifumi
Advantest America R&D Center, Inc.
Hoff Marc S.
Huynh Phuong
Morrison & Foerster / LLP
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