Method and structure to develop a test program for...

Details Method and structure to develop a test program for... Method and structure to develop a test program for...

2007-04-24

2007-04-24

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S108000, C702S120000, C702S121000, C702S122000, C717S124000

Reexamination Certificate

active

10918513

ABSTRACT:
A method for managing a pattern object file in a modular test system is disclosed. The method includes providing a modular test system, where the modular test system comprises a system controller for controlling at least one site controller, and where the at least one site controller controls at least one test module and its corresponding device under test (DUT). The method further includes creating an object file management framework for establishing a standard interface between vendor-supplied pattern compilers and the modular test system, receiving a pattern source file, creating a pattern object metafile based on the pattern source file using the object file management framework, and testing the device under test through the test module using the pattern object metafile.

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