Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2006-02-14
2006-02-14
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S179000, C702S178000
Reexamination Certificate
active
06999895
ABSTRACT:
A method (and structure) of optimizing a sampling period for a system having at least one measurable system parameter z, includes calculating a probability distribution function f(Tz,x). The time Tz,xis a first time that the measurable system parameter z will reach a predetermined system threshold x, given level z.
REFERENCES:
patent: 5285395 (1994-02-01), Kamayashi
patent: 5914936 (1999-06-01), Hatono et al.
patent: 6215768 (2001-04-01), Kim
patent: 6243610 (2001-06-01), Iino et al.
patent: 2002/0165958 (2002-11-01), Duffield et al.
Xin Guo, “When The “Bull” Meets The “Bear”—A First Passage Time Problem For A Hidden Markov Process”, 2001 Methodology and Computing in Applied Probability, vol. 3, pp. 135-143.
Dagum, et al. “An Optimal Algorithm For Monte Carlo Estimation”, 2000 Society for Industrial and Applied Mathematics,Siam J. Comput., vol. 29, No. 5, pp. 1484-1496, (no month).
Kallenberg, “Foundations Of Modern Probability”, Second Edition, 2001 Springer, pp. 274-275, (no month).
Guo Xin
Ray Bonnie K.
Kaufman, Esq Stephen C.
McGinn IP Law Group PLLC
Wachsman Hal
LandOfFree
Method and structure for dynamic sampling method in on-line... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and structure for dynamic sampling method in on-line..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and structure for dynamic sampling method in on-line... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3677321