Method and structure for avoiding hot carrier degradation...

Details Method and structure for avoiding hot carrier degradation... Method and structure for avoiding hot carrier degradation...

2011-04-19

2011-04-19

Nguyen, Danny (Department: 2836)

Electricity: electrical systems and devices

Safety and protection of systems and devices

Load shunting by fault responsive means

C361S111000

Reexamination Certificate

active

07929262

ABSTRACT:
In a ESD protection device, hot carrier degradation and soft leakage are reduced by introducing a dynamic driver that includes a RC circuit for keeping the triggering circuit of the ESD device in an on-state for a certain period of time. This allows the current through the ESD protection device to be reduced during the RC delay time.

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