Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2008-10-27
2011-11-01
Garber, Charles (Department: 2812)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S200000, C257SE31057, C257SE31058, C257SE31060, C257SE31063, C257SE31066, C257SE31073, C257SE31075, C257SE31076, C257SE31079, C257SE31080
Reexamination Certificate
active
08048705
ABSTRACT:
A method of forming a CMOS image sensor device, the method includes providing a semiconductor substrate having a P-type impurity characteristic including a surface region. The method forma first thickness of silicon dioxide in a first region of the surface region, a second thickness of silicon dioxide in a second region of the surface region, and a third thickness of silicon dioxide in a third region of the surface region. The method includes forming a first gate layer overlying the second region and a second gate layer overlying the third region, while exposing a portion of the first thickness of silicon dioxide. An N-type impurity characteristic is formed within a region within a vicinity underlying the first thickness of silicon dioxide in the first region of the surface region to cause formation of a photo diode device characterized by the N-type impurity region and the P-type substrate.
REFERENCES:
patent: 5903021 (1999-05-01), Lee et al.
patent: 6258673 (2001-07-01), Houlihan et al.
patent: 6498331 (2002-12-01), Kozlowski et al.
patent: 6545302 (2003-04-01), Han
patent: 6908839 (2005-06-01), Rhodes
patent: 2003/0062561 (2003-04-01), Guidash
patent: 2005/0001277 (2005-01-01), Rhodes
patent: 2007/0241372 (2007-10-01), Kao
patent: 1669149 (2005-09-01), None
patent: 1897253 (2007-01-01), None
Huo Jieguang
Yang Jianping
Abdelaziez Yasser
Garber Charles
Kilpatrick Townsend and Stockton LLP
Semiconductor Manufacturing International (Shanghai) Corporation
LandOfFree
Method and structure for a CMOS image sensor using a triple... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and structure for a CMOS image sensor using a triple..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and structure for a CMOS image sensor using a triple... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4286198