Method and ring oscillator circuit for measuring circuit...

Oscillators – With frequency calibration or testing

Reexamination Certificate

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C331S057000

Reexamination Certificate

active

07046094

ABSTRACT:
A method and ring oscillator circuit for measuring circuit delays over a wide operating range permits improved analysis of dynamic circuits. A pulse generator circuit provides a pulse to an input of a dynamic circuit under test, which may be a pre-charge or evaluation pulse that is triggered by a transition of an output of the dynamic circuit that occurs during the state opposite that of the state commanded by the pulse. The action of the circuit provides for measuring any amount of delay to the next transition in the opposite state irrespective of the pulse width. By providing a wide-range of operation, characteristics such as leakage, charge sharing, data dependent node capacitance, previous value dependence as well as other dynamic circuit behaviors may be determined. The ring oscillator circuit includes an enable start circuit that causes a first pulse to be generated by the one-shot when the ring oscillator circuit is enabled.

REFERENCES:
patent: 6538522 (2003-03-01), Aipperspach et al.
patent: 6734743 (2004-05-01), Korson et al.
patent: 6734744 (2004-05-01), Monzel et al.
patent: 6741136 (2004-05-01), Seo
patent: 6909301 (2004-06-01), Korson et al.

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