Method and related apparatus for chip testing

Details Method and related apparatus for chip testing Method and related apparatus for chip testing

2006-05-23

2006-05-23

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07049839

ABSTRACT:
A chip capable of performing self testing includes: an output circuit for generating output signals; a transmitting circuit coupled to the output circuit for transmitting output signals generated by the output circuit; a receiving circuit for receiving signals transmitted to the chip and generating corresponding receiving signals; a first multiplexer; and an input circuit coupled to an output port of the first multiplexer for receiving outputs of the first multiplexer, wherein the first multiplexer includes: a first input port coupled to the output circuit for receiving output signals generated by the output circuit; and a second input port coupled to the receiving circuit for receiving signals generated by the receiving circuit.

REFERENCES:
patent: 5254940 (1993-10-01), Oke et al.
patent: 5371457 (1994-12-01), Lipp
patent: 5534774 (1996-07-01), Moore et al.
patent: 6356096 (2002-03-01), Takagi et al.

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