Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Reexamination Certificate
2006-10-10
2006-10-10
Verbitsky, Gail (Department: 2859)
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
C323S315000, C327S513000, C327S538000, C374S170000
Reexamination Certificate
active
07118274
ABSTRACT:
A method and a reference circuit for bias current switching are provided for implementing an integrated temperature sensor. A first bias current is generated and constantly applied to a thermal sensing diode. A second bias current is provided to the thermal sensing diode by selectively switching a multiplied current from a current multiplier to the thermal sensing diode or to a load diode. The reference circuit includes a reference current source coupled to current mirror. The current mirror provides a first bias current to a thermal sensing diode. The current mirror is coupled to a current multiplier that provides a multiplied current. A second bias current to the thermal sensing diode includes the first bias current and the multiplied current from the current multiplier. The second bias current to the thermal sensing diode is provided by selectively switching the multiplied current between the thermal sensing diode and a dummy load diode.
REFERENCES:
patent: 3617778 (1971-11-01), Korom
patent: 4017748 (1977-04-01), Davis
patent: 4165642 (1979-08-01), Lipp
patent: 4645948 (1987-02-01), Morris et al.
patent: 4922131 (1990-05-01), Anderson et al.
patent: 5094546 (1992-03-01), Tsuji
patent: 5422832 (1995-06-01), Moyal
patent: 5453682 (1995-09-01), Hinrichs et al.
patent: 5639163 (1997-06-01), Davidson et al.
patent: 5903141 (1999-05-01), Tailliet
patent: 6008685 (1999-12-01), Kunst
patent: 6019508 (2000-02-01), Lien
patent: 6023185 (2000-02-01), Galipeau et al.
patent: 6149299 (2000-11-01), Aslan et al.
patent: 6255891 (2001-07-01), Matsuno et al.
patent: 6496056 (2002-12-01), Shoji
patent: 6531911 (2003-03-01), Hsu et al.
patent: 6737909 (2004-05-01), Jaussi et al.
patent: 6789939 (2004-09-01), Schrodinger et al.
patent: 6870357 (2005-03-01), Falik
patent: 6876250 (2005-04-01), Hsu et al.
patent: 6930538 (2005-08-01), Chatal
patent: 6957910 (2005-10-01), Wan et al.
patent: 2003/0086476 (2003-05-01), Mizuta
patent: 2005/0220171 (2005-10-01), Faour et al.
patent: 2005/0231283 (2005-10-01), Perry
Phan Nghia Van
Rosno Patrick Lee
Strom James David
Pennington Joan
Verbitsky Gail
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