Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-03-14
2006-03-14
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S035000, C702S036000
Reexamination Certificate
active
07013231
ABSTRACT:
A test methodology for use in a manufacturing process includes generating a test management matrix having a plurality of selectable test sites. Each test site indicates the optimum level of tests to be exercised on devices used to manufacture a product, such as a personal computer. Each test site is accessed through the intersection of inputs relating to aggregate test levels and quality of components used in the device. The tests identified at a selected test site are exercised to test the device.
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IBM Technical Disclosure Bulletin vol. 19, No. 6. Nov. 1976, “Relating Logic Design to Physical Geometry in LSI Chip”.
Bui Bryan
International Business Machines - Corporation
Ray-Yarletts Jeanine S.
Walling Meagan S
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