Method and program product to optimize manufacturing test...

Data processing: measuring – calibrating – or testing – Testing system – Of circuit

Reexamination Certificate

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C702S035000, C702S036000

Reexamination Certificate

active

07013231

ABSTRACT:
A test methodology for use in a manufacturing process includes generating a test management matrix having a plurality of selectable test sites. Each test site indicates the optimum level of tests to be exercised on devices used to manufacture a product, such as a personal computer. Each test site is accessed through the intersection of inputs relating to aggregate test levels and quality of components used in the device. The tests identified at a selected test site are exercised to test the device.

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IBM Technical Disclosure Bulletin vol. 19, No. 6. Nov. 1976, “Relating Logic Design to Physical Geometry in LSI Chip”.

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