Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-02-15
2005-02-15
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S073100, C703S014000, C703S018000
Reexamination Certificate
active
06856148
ABSTRACT:
A method for evaluating a power distribution network for a circuit has steps of creating a circuit model of the circuit in which all wires and transistors are represented as circuit elements, with the model comprising a plurality of nodes. A DC power analysis is performed on the circuit model to determine voltage drops at a plurality of the nodes.
REFERENCES:
patent: 5553008 (1996-09-01), Huang et al.
patent: 5828580 (1998-10-01), Ho
patent: 5933358 (1999-08-01), Koh
patent: 6311147 (2001-10-01), Tuan
patent: 6631502 (2003-10-01), Buffet et al.
Hewlett--Packard Development Company, L.P.
Nguyen Vincent Q.
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