Method and program for selecting product to be inspected

Details Method and program for selecting product to be inspected Method and program for selecting product to be inspected

2011-03-01

2011-03-01

Jarrett, Ryan A (Department: 2121)

Data processing: generic control systems or specific application

Specific application, apparatus or process

Product assembly or manufacturing

C702S083000

Reexamination Certificate

active

07899567

ABSTRACT:
An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.

REFERENCES:
patent: 6236901 (2001-05-01), Goss
patent: 2002/0029118 (2002-03-01), Yanaru et al.
patent: 2004/0225396 (2004-11-01), Maeritz et al.
patent: 2004/0236528 (2004-11-01), Steinkirchner et al.
patent: 2006/0178767 (2006-08-01), Lee et al.
patent: 1420310 (2004-05-01), None
patent: 1420312 (2004-05-01), None
patent: 9-269294 (1997-10-01), None
patent: 2004363288 (2004-12-01), None
SAP AG, “Production lot planning / individual project plann” manual, Apr. 2001, SAP AG, Release 4.6C.
SAP AG, “Inspection Lot Creation (QM-IM-IL)” manual, Apr. 2001, SAP AG, Release 4.6C.
Graf, David A., et al, “Inspection-Planning Development: An Evolutionary Approach Using Reliability Engineering as a Tool”, Reliability and Maintainability Symposium, 1994, Anaheim, CA, IEEE, Jan. 24, 1994, pp. 342-348.

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