Data processing: measuring – calibrating – or testing – Measurement system – Orientation or position
Reexamination Certificate
2007-10-02
2007-10-02
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Orientation or position
Reexamination Certificate
active
11368753
ABSTRACT:
The invention provides an aspherical workpiece leveling method for leveling an aspherical workpiece mounted on a tilt correction table. The method includes three-dimensionally measuring a surface of the aspherical workpiece containing an extreme value; deriving a secondary curved surface from the obtained three-dimensionally measured values to obtain an extreme value of the secondary curved surface as a temporary extreme value; obtaining three-dimensionally measured values at three or more points from the surround about the obtained temporary extreme value; obtaining a plane defined by the obtained three-dimensionally measured values at three or more points; and adjusting the tilt correction table for leveling the obtained plane.
REFERENCES:
patent: 5253429 (1993-10-01), Konno et al.
patent: 6745616 (2004-06-01), Katayama et al.
patent: 11-211426 (1999-08-01), None
patent: 2000-266534 (2000-09-01), None
Sakata Yukihiro
Takemura Fumihiro
Khuu Cindy D.
Mitutoyo Corporation
Nghiem Michael P.
Rankin, Hill Porter & Clark LLP
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