Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate
2007-05-29
2007-05-29
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Statistical measurement
C702S180000, C702S181000, C702S182000, C702S183000, C702S184000, C702S185000, C702S186000, C702S187000, C702S188000, C702S189000, C702S196000
Reexamination Certificate
active
11325135
ABSTRACT:
Measured values obtained in a measuring machine to be estimated are provided to estimate errors in the measured values. Based on the estimated errors in the measured values, a covariance matrix or correlation matrix of measured values is derived. The covariance matrix or correlation matrix is then subjected to eigenvalue decomposition to derive eigenvalues and eigenvectors. A normal random number with an expected value of 0 and a variance equal to an eigenvalue corresponding to the eigenvalue is generated as a coefficient of coupling for each eigenvector, and all eigenvectors are linearly coupled to generate pseudo-measured values of the measuring machine. The generated pseudo-measured values are subjected to statistic processing to estimate uncertainty of the measuring machine.
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Abbe Makoto
Nara Masayuki
Huynh Phuong
Mitutoyo Corporation
Rankin, Hill Porter & Clark LLP
Wachsman Hal
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