Method and product for processing system test data

Details Method and product for processing system test data Method and product for processing system test data

2005-11-29

2005-11-29

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

Reexamination Certificate

active

06970797

ABSTRACT:
A method for processing system test data is provided. The data is received in digital format in response to a system test and parsed to extract information relating to a system test site and a system component at the test site in need of maintenance. The parsed data is saved as new data to a previously populated database containing old data. The database is queried to compare the new data against the old data, and a report is generated that identifies a difference between the new data and the old data, thereby identifying a newly added data entry representative of a component in need of maintenance.

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patent: 2003/0235242 (2003-12-01), Fitch et al.

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