Method and probe for non-destructive measurement of the thicknes

Details Method and probe for non-destructive measurement of the thicknes Method and probe for non-destructive measurement of the thicknes

1991-06-25

1993-03-02

Snow, Walter E.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324232, G01R 3312

Patent

active

051912864

ABSTRACT:
Non-destructive methods of measurement for determining the thickness of thin layers, using the magneto-inductive method or the eddy-current method yield measured values which depend not only on the actual layer thickness present, but also on the shape of the measured object. It is the object of the invention to specify in a simple way, and without it being necessary for an operator to change his way of thinking, a device and a method in accordance with which the layer thickness indicated is virtually independent of the shape of the measured object. With regard to the device, this is achieved according to the invention when the probe has at least two different coil devices and, with regard to the method, when a corrected layer thickness is calculated from the different measured values of the two coil devices.

REFERENCES:
patent: 3986105 (1976-10-01), Nix et al.
patent: 4752739 (1988-06-01), Wang

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