Method and member for measuring stress distribution of...

Measuring and testing – Specimen stress or strain – or testing by stress or strain... – By loading of specimen

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

08056422

ABSTRACT:
When visualizing the stress distribution of natural bone, synthetic bone, or a member attached to either thereof without omitted points, in order to measure accurately in a variety of modes using an inexpensive system, a mechanoluminescence material thin film6is formed in advance on a bone material peripheral surface5in an appropriate area thereof including the portion where an insertion support portion4of an artificial hip prosthesis2is inserted into a hollow inside3of a damaged femur1or a synthetic bone simulating the damaged femur. The mechanoluminescence material thin film6portion is photographed over its entire circumference with an IICCD camera7from the external peripheral side thereof as or after the artificial hip prosthesis2is inserted. The obtained image is fed to a computer11to obtain a luminescence image8. The computer11outputs the intensities of the received light in the form of an image as is, so that the luminescence image8can be obtained easily. Particularly, the data about the intensities of the received light can be used as stress/strain data virtually as is. Such method is also suitable for dynamic analysis.

REFERENCES:
patent: 4265252 (1981-05-01), Chubbuck et al.
patent: 5018977 (1991-05-01), Wiley et al.
patent: 5247560 (1993-09-01), Hosokawa et al.
patent: 5284143 (1994-02-01), Rattner
patent: 5695496 (1997-12-01), Orsak et al.
patent: 5817945 (1998-10-01), Morris et al.
patent: 7060371 (2006-06-01), Akiyama et al.
patent: 7080561 (2006-07-01), Bohlmann et al.
patent: 7258817 (2007-08-01), Akiyama et al.
patent: 7509872 (2009-03-01), Hyodo et al.
patent: 7769550 (2010-08-01), Hyodo et al.
patent: 2001/0017059 (2001-08-01), Xu et al.
patent: 2003/0181800 (2003-09-01), Bonutti
patent: 2005/0182325 (2005-08-01), Mano et al.
patent: 2006/0014231 (2006-01-01), Van Rompaey et al.
patent: 2006/0252045 (2006-11-01), Chatterjee-Kishore et al.
patent: 03-012190 (1991-01-01), None
patent: 06-180260 (1994-06-01), None
patent: 07-311103 (1995-11-01), None
patent: 2732178 (1998-03-01), None
patent: 2001-215157 (2001-08-01), None
patent: 2003-518973 (2003-06-01), None
patent: 01/49173 (2001-07-01), None
International Search Report of PCT/JP2006/300199, date of mailing Apr. 11, 2006.
Japanese Office Action dated Oct. 26, 2010, issued in corresponding Japanese Patent Application No. 2006-553862.
Japanese Office Action dated Jun. 22, 2010 issued in corresponding Japanese Application No. 2006-553862.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and member for measuring stress distribution of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and member for measuring stress distribution of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and member for measuring stress distribution of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4274461

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.