Method and measuring device for locating enclosed objects

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S067000

Reexamination Certificate

active

07106072

ABSTRACT:
A method for locating objects enclosed in a medium, according to which a detection signal is generated by at least one capacitive sensor device, the detection signal penetrating the medium that is to be analyzed in such a way that information is obtained about an object that is enclosed in the medium by evaluating the detection signal, particularly by measuring impedance, wherein, to obtain depth information about the object that is enclosed in the medium, an algorithm is used to evaluate the detection signal that calculates a compensation for drift effects of the capacitive sensor device that is generating the detection signal.

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patent: 6211662 (2001-04-01), Bijawat et al.
patent: 6249113 (2001-06-01), Kranz et al.
patent: 6492821 (2002-12-01), Marko et al.
patent: 94/04932 (1994-03-01), None
patent: 01 04648 (2001-01-01), None

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