X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate
2007-01-31
2008-10-21
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Fluorescence
C378S044000
Reexamination Certificate
active
07440542
ABSTRACT:
A method and a measuring arrangement are disclosed for nondestructive analysis of an examination object. In at least one embodiment of the method, x-radiation having a specific energy spectrum is generated by an x-ray source, with the aid of at least one x-ray/optical grating in the beam path of the x-radiation there is generated a standing wave field of this x-radiation that is positioned at least partially in the examination object, and the radiation excited by the x-ray standing wave field in the examination object is measured as a function of at least one relative position between the examination object and the x-ray standing wave field. Further, a material distribution in the examination object is inferred from the measurement result of the radiation excited by the x-ray standing wave field.
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Baumann Joachim
Engelhardt Martin
Freudenberger Jörg
Hempel Eckhard
Hoheisel Martin
Harness & Dickey & Pierce P.L.C.
Siemens Aktiengesellschaft
Song Hoon
LandOfFree
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