Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-05-20
2008-09-16
Nguyen, Vincent Q. (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C606S035000
Reexamination Certificate
active
07425835
ABSTRACT:
A method and a measurement apparatus are provided for determining the transition impedance between two electrode parts of a subdivided neutral electrode used in high-frequency surgery. These make it possible for the purely capacitive component of the transition impedance to be measured. For this purpose a resonant-frequency shift is measured, which occurs when a basic resonant circuit is expanded to an expanded resonant circuit by incorporating the two electrode parts into it in parallel. In particular, in order to determine the basic resonant frequency of the basic resonant circuit and/or the sample resonant frequency of the expanded resonant circuit, the phase shift between current and voltage is measured and the frequency is adjusted until current and voltage are in phase.
REFERENCES:
patent: 3913583 (1975-10-01), Bross
patent: 3933157 (1976-01-01), Bjurwill et al.
patent: 4200104 (1980-04-01), Harris
patent: 4416276 (1983-11-01), Newton et al.
patent: 4818954 (1989-04-01), Flachenecker et al.
patent: 5087257 (1992-02-01), Farin et al.
patent: 5267997 (1993-12-01), Farin et al.
patent: 5688269 (1997-11-01), Newton et al.
patent: 6205857 (2001-03-01), Nakajima
patent: 6275786 (2001-08-01), Daners
patent: 6437582 (2002-08-01), Rode et al.
patent: 6860881 (2005-03-01), Sturm et al.
patent: 7300435 (2007-11-01), Wham et al.
patent: 1 139 927 (1962-11-01), None
patent: 197 14972 (1998-10-01), None
patent: 96/19152 (1996-06-01), None
patent: 2004/028385 (2004-04-01), None
Dickstein & Shapiro LLP
ERBE Elektromedizin GmbH
Nguyen Hoai-An D
Nguyen Vincent Q.
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