Method and means for reliability and maintainability analysis

Details Method and means for reliability and maintainability analysis Method and means for reliability and maintainability analysis

1981-04-09

1984-09-18

Atkinson, Charles E.

Excavating

364578, G06F 1100, G06F 1520

Patent

active

044728042

ABSTRACT:
A failure simulation system utilizing fast failing units whereby system availability and reliability analysis can be completed in highly compressed periods of time. Each fast failing unit includes a random pulse generator and a variable failure rate pulse generator. Coincidence of pulses from the two generators signifies a unit failure. The pulse rate of the variable pulse generator is correlated to the probable time-dependent failure rate of the unit when new, as burned in, as aged, and as repaired. A one shot multivibrator responsive to unit repair resets the unit to an operational state after a determined repair time and adjusts the pulse rate of the variable pulse generator to correlate with a repaired unit. Deterministic and stochastic common mode inputs for each fast failure unit allow other units to either fail or accelerate failure, respectively, of the unit. Since the fast failing units have two logic states, the units can be interconnected by logic means in general configurations to simulate the performance of virtually any large complex system.

REFERENCES:
patent: 3702011 (1972-10-01), Armstrong
patent: 3715573 (1973-02-01), Vogelsberg
patent: 4064394 (1977-12-01), Allen
patent: 4139895 (1979-02-01), Kurkjian et al.
Rothbart et al., Experiments with Stochastic Systems, 1981 Proceedings, Annual Reliability and Maintainability Symposium, Jan., 1980, pp. 185-191.
Frey, Jr. et al., Digital Pseudorandom Error and Burst Error Generator, IBM Technical Disclosure Bulletin, vol. 11, No. 12, May, 1969, pp. 1718-1719.
Lewis et al., Method for Time-Dependent Failure Rates Analysis, IBM Technical Disclosure Bulletin, vol. 16, No. 5, Oct. 1973, pp. 1686-1688.

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