Method and means for measuring guidance errors at one or more po

Details Method and means for measuring guidance errors at one or more po Method and means for measuring guidance errors at one or more po

1986-11-19

1988-07-19

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356375, H01J 4014

Patent

active

047587202

ABSTRACT:
In order to initiate the operation of an incremental-correction measurement system, which measures such guidance errors as instantaneous lateral offset of a movable machine part with respect to its guidance direction (Y), a reference mark is provided by two cylindrical lenses (4, 5) which are arranged at an angle to each other and to the guidance direction. Since the distance intercepts for Y-direction scanning of and between the two cylindrical lenses is dependent on the instantaneous lateral offset (.DELTA.X) of the guided part, it is possible to determine the absolute offset values (.DELTA.X.sub.1, .DELTA.X.sub.2) of two spaced incremental-correction measurement systems (K1, K2), using pairs of pulses (A.sub.1/2, B.sub.1/2) generated by two signal transmitters (KNIP1, KNIP2) upon their scanning traverse of the respective cylindrical lenses in the course of a single calibration run.

REFERENCES:
patent: 4301363 (1981-11-01), Suzuki et al.
patent: 4465373 (1984-08-01), Tamaki et al.
patent: 4519140 (1985-05-01), Schmitt
patent: 4579453 (1986-04-01), Makita
patent: 4611122 (1986-09-01), Nakano et al.
patent: 4645925 (1987-02-01), Schmitt

Affiliated with

Also associated with

Rating

Method and means for measuring guidance errors at one or more po does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and means for measuring guidance errors at one or more po, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and means for measuring guidance errors at one or more po will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-598750