Method and means for internal error check in a digital memory

Details Method and means for internal error check in a digital memory Method and means for internal error check in a digital memory

1981-02-19

1983-05-17

Atkinson, Charles E.

Excavating

G06F 1110, G11C 2900

Patent

active

043843530

ABSTRACT:
A semiconductor digital memory such as a charge coupled device is provided with error detection capability. Error logic responsive to a group of data on the input bus generates a first error code which is stored in memory along with the group of data. When the data is retrieved from memory similar error logic generates a second error code. The first and second error codes are compared, and if the codes are identical the data is assumed to be correct. If codes differ then the data is discarded or errors therein are identified and corrected.

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Goetze et al., Single Error Correction in CCD Memories, IBM Technical Disclosure Bulletin, vol. 23, No. 1, Jun. 1980, pp. 215-216.
Basham, New Error-Correcting Technique for Solid-State Memories Saves Hardware, Computer Design, Oct. 1976, pp. 110-113.

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