Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-02-06
2007-02-06
Hirshfeld, Andrew H. (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S537000
Reexamination Certificate
active
11284789
ABSTRACT:
A method automatically tests a parameter of an electronic component to determine whether the component has an acceptable value. The method employs an automatic electronic component testing machine having at least first and second measurement positions where the parameter can be measured. The testing process itself may falsely cause the value to appear to be unacceptable when the value is actually acceptable. The method places the component in a first measurement position and measures the parameter in the first position, thereby generating a first measured parameter value. The method also places the component in a second measurement position and measures the parameter in the second position, thereby generating a second measured parameter value. The method rejects the component only if all measured values are unacceptable, whereby the probability of falsely rejecting the component is less than if only a single measuring step were performed.
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“The Capacitor,” general information. No publication date.
ESI 3340 Enhanced Productivity MLCC Multi-Function Tester, Oct. 2003.
“Improve Your Designs with Large Capacitance Value Multi-Layer Ceramic Chip (MLCC) Capacitors”, Panasonic Industrial Company, Jul. 3, 2003.
“QuadTech” Application Notes, QuadTech Incorporated, Feb. 2002.
ESI Passive Components, http://www.esi.com/products/pd—ecs.asp, viewed Nov. 20, 2004. (Best available copy).
Garcia Douglas John
Kim Kyung Young
Lowman Locke
Electro Scientific Industries Inc.
Hirshfeld Andrew H.
Natalini Jeff
Stoel Rives LLP
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