Excavating
Patent
1989-05-18
1991-08-27
Smith, Jerry
Excavating
371 223, 371 226, 371 225, G01R 3118, G01R 3126
Patent
active
050439863
ABSTRACT:
A method of partial scan design for chip testing and a circuit produced in accordance with the method in which the selection of scan memory elements eliminates cycles in the circuit while the circuit is in a test mode. Cycles are defined as feedback paths from an output of a memory element to an input of the memory element. Cycle length is the number of memory elements in a feedback path. Experimental data suggests that test complexity grows exponentially with the cycle length. By eliminating cycles of desired lengths, the set of scan memory elements may be only a small fraction of the total memory elements of a circuit.
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Agrawal Vishwani D.
Cheng Kwang-Ting
AT&T Bell Laboratories
Herndon J. W.
Hua Ly V.
Nelson G. E.
Smith Jerry
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