Adhesive bonding and miscellaneous chemical manufacture – Differential fluid etching apparatus – With plasma generation means remote from processing chamber
Reexamination Certificate
2005-04-26
2005-04-26
Mills, Gregory (Department: 1763)
Adhesive bonding and miscellaneous chemical manufacture
Differential fluid etching apparatus
With plasma generation means remote from processing chamber
C156S345380, C156S345110, C156S345330, C156S345230, C134S113000
Reexamination Certificate
active
06884317
ABSTRACT:
Method for etching a substrate wherein, after placing in an etching chamber, said substrate is treated with a mixture of HF and acetic acid. Acetic acid is introduced into the chamber first, followed by the hydrogen fluoride. Hydrogen fluoride is introduced via an intermediate stage during which the hydrogen fluoride is stored in an auxiliary chamber. By this means back-flow of a corrosive mixture consisting of hydrogen fluoride and acetic acid into the piping assembly for hydrogen fluoride is prevented and, thus, the life of the piping assembly concerned is appreciably prolonged and metal contamination on substrate treated later is prevented.
REFERENCES:
patent: 5022961 (1991-06-01), Izumi et al.
patent: 5879459 (1999-03-01), Gadgil et al.
patent: 6162323 (2000-12-01), Koshimizu
patent: 6333275 (2001-12-01), Mayer et al.
patent: 6432255 (2002-08-01), Sun et al.
patent: 0 335 313 (1989-10-01), None
patent: WO 8701508 (1987-03-01), None
patent: WO 9427315 (1994-11-01), None
Maes Jan Willem Hubert
Sprey Hessel
Storm Arjen Benjamin
ASM International N.V.
Knobbe Martens Olson & Bear LLP
MacArthur Sylvia R.
Mills Gregory
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