Method and IC for detecting capacitance variation

Details Method and IC for detecting capacitance variation Method and IC for detecting capacitance variation

2006-08-15

2006-08-15

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S520000, C324S674000

Reexamination Certificate

active

07091727

ABSTRACT:
A method and an integrated circuit for detecting capacitance variation includes the steps of: generating a detection frequency for capacitance variation and a detection frequency which lags the detection frequency by k times, wherein the detection frequencies are based on a time divisional format; operating the detection frequencies to produce a difference frequency; operating variation rate of the difference frequency; and comparing the variation rate of the difference frequency with a predetermined detection level, and outputting a signal indicative of capacitance variation if the variation rate of the difference frequency is greater than the detection level.

REFERENCES:
patent: 3694742 (1972-09-01), Bergmanis et al.
patent: 3805149 (1974-04-01), Delapierre
patent: 4794320 (1988-12-01), Chang
patent: 5136262 (1992-08-01), Spencer
patent: 5594353 (1997-01-01), Hemphill
patent: 6194903 (2001-02-01), Schulz
patent: A 09-089943 (1997-04-01), None

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