Method and equipment for mapping radiation deflection

Details Method and equipment for mapping radiation deflection Method and equipment for mapping radiation deflection

1981-10-22

1984-07-10

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

356128, 250237G, G01B 1114

Patent

active

044590270

ABSTRACT:
Equipment and method for mapping an object using moire deflectometry wherein collimated radiation deflected from the object is used to generate a moire pattern and wherein by measuring linear deflections in the pattern, variations in characteristics of the object is determined.

REFERENCES:
patent: 2541437 (1951-02-01), Prescott
patent: 4139291 (1979-02-01), Parthasarathy
Oster et al., "Moire Patterns" Scientific American, May 1963, pp. 54-63.
Terada et al., "Photogrametric Application of Moire Fringes Produced with a Parallel Beam of Light" Optical Engineering, vol. 18, No. 4 (Jul.-Aug. 1979), pp. 399-402.
Kawara, "Corneal Topography Using Moire Countour Fringes" Applied Optics, vol. 18, No. 21, (Nov. 1, 1979) pp. 3675-3678.

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