Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Reexamination Certificate
2011-07-19
2011-07-19
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
C324S229000, C324S242000, C324S243000, C324S754210, C324S762010
Reexamination Certificate
active
07982457
ABSTRACT:
The present invention is a method and an eddy current system for non-contact determination of the resistance between the current lead stripe and the coating during continuous fabrication of chemical power sources such as batteries, supercapacitors, photovoltaic modules and the like. Both the method and the non-destructive test system for practicing the method are described. The method includes placing of an integrated measuring transducer containing two strap-type eddy current probes above the surface of the coating applied to the metallic current lead stripe in the region of the shaft guiding the stripe movement, so that all the points of the operating surface of the transducer being at an equal distance from the stripe surface coating so that the two probes would take measurements on the same area of the coating.
REFERENCES:
patent: 6961133 (2005-11-01), Caton et al.
patent: 2002/0149360 (2002-10-01), Le
patent: 2004/0070393 (2004-04-01), Sarfaty et al.
patent: 2005/0104585 (2005-05-01), Bilik et al.
patent: 2006/0109003 (2006-05-01), Redko et al.
Khandetskyy Volodymyr
Novak Peter
Redko Oxana V.
Redko Volodymyr I.
Shembel Elena M.
Chan Emily Y
Enerize Corporation
Inventa Capital PLC
Nguyen Ha Tran T
Shariff, Esq. Michael G.
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