Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-18
2006-04-18
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C439S073000
Reexamination Certificate
active
07030638
ABSTRACT:
An integrated circuit (IC) package testing device using a selectable number of leaf springs to provide a resilient and consistent normal force to the IC package and the method of operating the device. The leaf springs are shaped to provide the proper compliance and resilient force and are shaped to fit side-by-side within the lid of the device. The springs can be easily changed for differently sized IC packages.
REFERENCES:
patent: 5882221 (1999-03-01), Nguyen et al.
patent: 6025732 (2000-02-01), Foo et al.
patent: 6086387 (2000-07-01), Gallagher et al.
patent: 6304073 (2001-10-01), Saito
Wells-CTI, Phoenix, Arizona, Assembly Drawing, Model No. 693, Part No. 693-1425AB0436A1-0, Dec. 4, 2001.
Wells-CTI, Phoenix, Arizona, Assembly Drawing, Model No. 692, Part No. 692-0575-16, Jun. 1, 2001.
Wells-CTI, Phoenix, Arizona, Assembly Drawing, Model No. 654, Part No. 654048629010808, Apr. 22, 1997.
Kobert Russell M.
Marger Johnson & McCollom PC
Nguyen Vinh
Wells-CTI, LLC
LandOfFree
Method and device with variable resilience springs for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device with variable resilience springs for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device with variable resilience springs for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3578462