Method and device to clean probes

Details Method and device to clean probes Method and device to clean probes

2007-12-11

2007-12-11

Hess, Bruce H. (Department: 1774)

Stock material or miscellaneous articles

Composite

C156S242000, C451S527000, C451S009000

Reexamination Certificate

active

10186396

ABSTRACT:
A probe cleaning system automatically detects a surface of a probe cleaning device during a cleaning process by providing a predetermined finish on the surface of the probe cleaning device. The predetermined finish can include a textured or machined finish or a marking, such that the predetermined finish provides contrast against the surface. Cameras in the system automatically focus on the surface, with the predetermined finish. This in-focus condition is related to a distance between probes and the surface. Once an in-focus condition is determined, the system performs an automated cleaning process by interacting the probes with the probe cleaning device.

REFERENCES:
patent: 6682893 (2004-01-01), Taylor et al.
patent: 6757116 (2004-06-01), Curtiss et al.
patent: 6777966 (2004-08-01), Humphrey et al.

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