Measuring and testing – Inspecting
Reexamination Certificate
2005-11-08
2010-02-02
Williams, Hezron (Department: 2856)
Measuring and testing
Inspecting
Reexamination Certificate
active
07654161
ABSTRACT:
The invention relates to a method and a device of inspection of a rolled band, wherein a band sample (M) is inspected on a first face then turned over for the inspection of a second face.According to the invention, by running parallel to its longitudinal axis, the band sample (M) is brought between two spaced apart grips (6, 6′) (7, 7′) which are clamped respectively on each transversal end (M1, M2) of the sample (M), both grips (6, 6′) (7, 7′) are spaced apart longitudinally from one another so as to stretch the sample for visual inspection of a first face, then the sample is turned over, by simultaneous rotation of both grips (6, 6′) (7, 7′) around the longitudinal axis O, while holding the tension applied, so as to proceed to the inspection of the second face, such tension being sufficient to conduct the inspection without the sample contacting a table.The invention enables, in particular, the inspection of a band at the exit of a continuous rolling line.
REFERENCES:
patent: 3125229 (1964-03-01), Mulquin et al.
patent: 2004/0174518 (2004-09-01), Naiki et al.
patent: 2710863 (1995-04-01), None
patent: 57-94417 (1982-06-01), None
patent: 59-113916 (1984-06-01), None
patent: 5-223728 (1993-08-01), None
patent: 05223728 (1993-08-01), None
patent: 06304655 (1994-11-01), None
Bellamy Tamiko D
Greenberg Laurence A.
Locher Ralph E.
Siemens VAI Metals Technologies SAS
Stemer Werner H.
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