Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1996-07-08
1997-12-16
Nguyen, Vinh P.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324765, 324718, 437 8, G01N 1500
Patent
active
056989881
ABSTRACT:
A method and device of readily detecting deterioration of a sample at low cost, which do not require any maintenance and monitoring of the sensor properties, and accordingly can decrease a load assigned to a system side. A conductive sensor having a pair of electrodes and a conductive film which is disposed between the pair of electrodes and is composed of a conductive material formed in a continuous region so as to connect the pair of electrodes at least electrically in its initial state is placed in an atmosphere where the sample is placed. The percolation transition of the conductive material of the conductive film occurs due to the grain growth thereof, accompanied by the deterioration of the inorganic material composing the sample due to the grain growth thereof. By monitoring the variation in electric resistance of the conductive sensor due to the percolation transition of the conductive material, the deterioration of the sample can be detected.
REFERENCES:
patent: 3974443 (1976-08-01), Thomas
patent: 4100486 (1978-07-01), Casowitz
patent: 4144493 (1979-03-01), Lee
patent: 5051690 (1991-09-01), Maly
patent: 5082792 (1992-01-01), Pasch
Motohiro Tomoyoshi
Sakamoto Yoshiyuki
Yokota Koji
Kabushiki Kaisha Toyota Chuo Kenkyusho
Nguyen Vinh P.
Solis Jose M.
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