Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2005-08-09
2010-02-09
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
By light interference
For dimensional measurement
C356S497000
Reexamination Certificate
active
07659993
ABSTRACT:
A method for sensing a wave-front of specimen light scattered from an illuminated area in a specimen (10) includes the steps of focusing illumination light into the specimen (10), directing specimen light scattered in the specimen (10) to a detector device (50) having a plurality of detector elements (51) and being capable to sense light with local resolution, detecting sample light contained in the specimen light with the detector device (50), said sample light being scattered in a predetermined sample plane (11) of the specimen (10) and being selected by a time-based gating of the specimen light, locally resolved measuring phase information of the sample light, and reconstructing the wave-front of the sample light on the basis of the phase information. Furthermore, a method of microscopic imaging with adapted illumination light is described.
REFERENCES:
patent: 5489984 (1996-02-01), Hariharan et al.
patent: 5570182 (1996-10-01), Nathel et al.
patent: 6608717 (2003-08-01), Medford et al.
patent: 6649895 (2003-11-01), Wirth
patent: 6769769 (2004-08-01), Podoleanu et al.
patent: 7168807 (2007-01-01), Chernyak et al.
patent: 2002/0033947 (2002-03-01), Grunwald et al.
patent: 2004/0061830 (2004-04-01), Hellmuth et al.
patent: 2004/0196450 (2004-10-01), Levecq et al.
patent: 2006/0058682 (2006-03-01), Miller et al.
Albert et al., “Smart microscope: an adaptive optics learning system for aberration correction in multiphoton confocal microscopy”, Optics Letters, vol. 25 (1), pp. 52-54 (2000).
Merkle et al., “Successful Tests of Adaptive Optics”, ESO Messenger, vol. 58, pp. 1-4 (1989).
Platt et al., “Lenticular Hartmann Screen”, Optical Sciences Center Newsletter, vol. 5, p. 15 (1971).
Bille et al., “Imaging of the Retina by Scanning Laser Tomography”, SPIE, vol. 1161, pp. 417-425 (1989).
Liang et al., “Supernormal vision and high-resolution retinal imaging through adaptive optics”, J. Opt. Soc. Am. A., vol. 14 (11), pp. 2884-2892 (1997).
Sherman et al., “Adaptive correction of depth-induced aberrations in multiphoton scanning microscopy using a deformable mirror”, Journal of Microscopy, vol. 206, pp. 65-71 (2002).
Marsh et al., “Practical implementation of adaptive optics in multiphoton microscopy”, Optics Express, vol. 11 (10), pp. 1123-1130 (2003).
Neil et al., “Adaptive aberration correction in a two-photon microscope”, Journal of Microscopy, vol. 200, pp. 105-108 (2000).
Cubalchini, “Modal wave-front estimation from phase derivative measurements”, J. Opt. Soc. Am., vol. 69, pp. 972-977 (1979).
Malacara, “Optical Shop Testing” in “Wiley Series in Pure and Applied Optics”, John Wiley & Sons, Inc., New York, 2ndEd., pp. 510-513 (1992).
Carré, Installation et utilisation du comparateu photoélectrique et interférentiel du Bureau International des Poids et Mesures, Metrologia, vol. 2, pp. 13-23 (1966).
Crane, Chapter V., “Interference Phase Measurement”, Applied Optics, vol. 8, pp. 538-542 (1969).
Miller et al., “Coherence Gating and Adaptive Optics in the Eye”, SPIE, vol. 4956, pp. 65-72 (2003).
Ash et al., “Optimal Hartmann sensing at low light levels”, Optics Communications, vol. 156, pp. 10-15 (1998).
Roggemann et al., “Comparison of Fourier phase spectrum estimation using deconvolution from wavefront sensing and bispectrum reconstruction”, Optics Communications, vol. 133, pp. 381-392 (1997).
Denk Winfried
Feierabend Marcus
Rückel Markus
Caesar Rivise Bernstein Cohen & Pokotilow Ltd.
Chowdhury Tarifur
Hansen Jonathan M
Max-Planck-Gesellschaft zur Forderung der Wissenschaften e.V.
LandOfFree
Method and device for wave-front sensing does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for wave-front sensing, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for wave-front sensing will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4161189