Method and device for verifying output signals of an...

Details Method and device for verifying output signals of an... Method and device for verifying output signals of an...

2006-08-31

2008-08-05

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S124000

Reexamination Certificate

active

07409308

ABSTRACT:
A system and method for testing an integrated circuit is provided. In one embodiment, a method includes comparing the signal level of the output signal of the integrated circuit to the signal level of a reference signal, wherein a comparison signal is output, which has a first or a second value depending on whether the actual signal level of the output signal is above or below the actual signal level of the reference signal; determining the value of the comparison signal at a certain time; evaluating the value of the comparison signal determined at the time by way of a default; and outputting an error signal if the determined value of the comparison signal does not correspond to the default.

REFERENCES:
patent: 4849973 (1989-07-01), Kubota
patent: 5578935 (1996-11-01), Burns
patent: 6201746 (2001-03-01), Koo et al.
patent: 7032151 (2006-04-01), Halder et al.
patent: 2005/0114734 (2005-05-01), Beer et al.
patent: 2007/0159234 (2007-07-01), Heinen et al.

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