X-ray or gamma ray systems or devices – Specific application – Fluorescence
Patent
1998-09-08
2000-09-12
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Fluorescence
378 48, 378 50, 378 44, G01N 23223
Patent
active
061188441
ABSTRACT:
In a method for the determination of the measuring uncertainty for a device for X-ray fluorescence slice thickness measurements during measurement of a layer of a sample under investigation, a spectrum S(K) simulating an actual fluorescent radiation spectrum is generated for the channels K of a spectrum and for a given thickness d of the layer and, in each channel K, a random number generator is used to repetitively accumulate a random value to construct a total number N(K) of events registered in the K-th channel in measurement time t and the standard deviation .sigma.(d) is determined from the spectrum of slice thicknesses d extracted by means of the repetitive random values as measure of the measurement uncertainty.
REFERENCES:
patent: 5029337 (1991-07-01), MacKenzie et al.
patent: 5113421 (1992-05-01), Gignoux et al.
patent: 5657363 (1997-08-01), Hossain et al.
patent: 6038280 (2000-03-01), Rossiger et al.
Helmut Fischer GmbH & Co Institut fur Elektronik und Messtechnik
Hobden Pamela R.
Porta David P.
Vincent Paul
LandOfFree
Method and device for the determination of measurement uncertain does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for the determination of measurement uncertain, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for the determination of measurement uncertain will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-102999