Method and device for the determination of measurement uncertain

Details Method and device for the determination of measurement uncertain Method and device for the determination of measurement uncertain

1998-09-08

2000-09-12

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 48, 378 50, 378 44, G01N 23223

Patent

active

061188441

ABSTRACT:
In a method for the determination of the measuring uncertainty for a device for X-ray fluorescence slice thickness measurements during measurement of a layer of a sample under investigation, a spectrum S(K) simulating an actual fluorescent radiation spectrum is generated for the channels K of a spectrum and for a given thickness d of the layer and, in each channel K, a random number generator is used to repetitively accumulate a random value to construct a total number N(K) of events registered in the K-th channel in measurement time t and the standard deviation .sigma.(d) is determined from the spectrum of slice thicknesses d extracted by means of the repetitive random values as measure of the measurement uncertainty.

REFERENCES:
patent: 5029337 (1991-07-01), MacKenzie et al.
patent: 5113421 (1992-05-01), Gignoux et al.
patent: 5657363 (1997-08-01), Hossain et al.
patent: 6038280 (2000-03-01), Rossiger et al.

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